DIP-View is a pioneer in High Resolution Deflectometry to measure and analyze critical surfaces for Off-Line quality control and In-Line inspection applications. DIP-View is adressing multiple segments of the industrial markets
DIP-View Products
D-SURFACE VIEW
Deflectometry-based surface inspection & flatness measurement
D-Surface View is intended to help manufacturers
of wafers up to 300-mm diameter reduce costs and chipmakers to improve yields for devices made with finest process technology. The equipment can be used for wafer surface quality control; it qualifies surface roughness, shape, flatness and topography in one single measurement of a bare or processed wafer. Its very high resolution performances bring fast, reliable, and highly sensitive solutions particularly adapted to off-line or in-line, surface local / global inspections in multiple industries.
For a full list of all our product partners, click HERE. To place an order or find out more information, please contact us using our contact form, found HERE.
For more information on DIP-View, visit their website.